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Complete search in test generation for industrial circuits with improved bus-conflict detection

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3 Author(s)
van der Linden, J.T. ; Delft Univ. of Technol., Netherlands ; Konijnenburg, M.H. ; van de Goor, A.J.

Test Pattern Generation (TPG) for sequential and/or 3-state circuits involves two important aspects which often are handled incorrectly: bus conflict detection and completeness of search in TPG. The correct handling of both aspects strongly depends on the signal model used by TPG. We propose a novel, set-based, signal model using the power-set (i.e., the set of all possible subsets) of the basic values {0, 1, Z}. TPG using this signal model guarantees complete search, provides exact bus-conflict detection, and is more efficient than TPG using the traditional signal models for J-state and sequential circuits. Experimental results demonstrate this by higher fault efficiencies combined with a large reduction of backtracking and computing time for sequential ISCAS'89 and industrial circuits

Published in:

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

Date of Conference:

2-4 Dec 1998