Cart (Loading....) | Create Account
Close category search window
 

Complete search in test generation for industrial circuits with improved bus-conflict detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
van der Linden, J.T. ; Delft Univ. of Technol., Netherlands ; Konijnenburg, M.H. ; van de Goor, A.J.

Test Pattern Generation (TPG) for sequential and/or 3-state circuits involves two important aspects which often are handled incorrectly: bus conflict detection and completeness of search in TPG. The correct handling of both aspects strongly depends on the signal model used by TPG. We propose a novel, set-based, signal model using the power-set (i.e., the set of all possible subsets) of the basic values {0, 1, Z}. TPG using this signal model guarantees complete search, provides exact bus-conflict detection, and is more efficient than TPG using the traditional signal models for J-state and sequential circuits. Experimental results demonstrate this by higher fault efficiencies combined with a large reduction of backtracking and computing time for sequential ISCAS'89 and industrial circuits

Published in:

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

Date of Conference:

2-4 Dec 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.