Cart (Loading....) | Create Account
Close category search window
 

Constant charge and constant potential models for electrostatic discharge and the human body

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Greason, W.D. ; Fac. of Eng. Sci., Univ. of Western Ontario, London, Ont., Canada

Real electrostatic discharge (ESD) events are charge-driven phenomena. System capacitance coefficients and body potentials change as a charged body approaches another body; a discharge occurs when the electric field between the bodies exceeds the critical breakdown value. Test methods used to simulate ESD are voltage driven; both air discharge and direct current injection methods are specified in terms of the potential applied to the probe of the simulator. In this paper, the results of an analysis of constant charge and constant potential models for ESD involving the human body and another body are presented. The interpretation of the results provide a better understanding of ESD test methods and their use in the simulation of real ESD events

Published in:

Industry Applications, IEEE Transactions on  (Volume:35 ,  Issue: 1 )

Date of Publication:

Jan/Feb 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.