By Topic

Circulating power, RF magnetic field, and RF current density of shielded dielectric resonators for power handling analysis of high-temperature superconducting thin films of arbitrary thickness

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mazierska, J. ; Dept. of Comput. & Electr. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia ; Grabovickic, R.

In the current quest for HTS films with negligible power effects at high RF power levels for wireless communications, accurate calculations of a maximum RF magnetic field H/sub max/ and of a maximum RF current density J/sub max/ flowing on the surface of superconducting films is necessary to allow for any sensible conclusions and comparisons. As the dielectric resonator method is used most frequently for investigation of HTS losses, the authors discuss in this paper a dependence of the circulating power and of a maximum RF magnetic field H/sub max/ on dielectric resonators' geometry as well as of the maximum RF current density J/sub max/ flowing on the surface of superconducting films on the films' thickness, for a general case of a resonator shielded in a metallic cavity. The authors' results demonstrate that under the same input power levels the same HTS films may be exposed to differing RF power level conditions, depending on the cavity to dielectric radius ratio and thickness of superconducting films. This means that there may be a significant discrepancy between calculated and real power handling capabilities of HTS films tested in different dielectric resonators unless correct formulas are used.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:8 ,  Issue: 4 )