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On-wafer characterization of millimeter-wave antennas for wireless applications

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2 Author(s)
Simons, Rainee N. ; NYMA Group, NASA Lewis Res. Center, Cleveland, OH, USA ; Lee, Richard Q.

This paper demonstrates a deembedding technique and a direct on-substrate measurement technique for fast and inexpensive characterization of miniature antennas for wireless applications at millimeter-wave frequencies. The technique is demonstrated by measurements on a tapered slot antenna (TSA). The measured results at Ka-band frequencies include input impedance, mutual coupling between two TSA's, and absolute gain of TSA

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:47 ,  Issue: 1 )