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40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization

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6 Author(s)

A versatile pulsed I(V) and 40-GHz RF measurement system is described with all the know-how and methods to perform efficient, safe, and reliable nonlinear transistor measurements. Capability of discrimination between thermal and trapping effects with a pulse setup is demonstrated. Capture and emission constant times of trapping effects are measured. A method to electrically measure the thermal resistance and capacitance of transistors with a pulse setup is proposed

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:46 ,  Issue: 12 )

Date of Publication:

Dec 1998

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