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Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-μm wavelength

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6 Author(s)
Reimann, O. ; Inst. of Solid State Phys., Tech. Univ. Berlin, Germany ; Huhse, D. ; Droge, E. ; Botcher, E.H.
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We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 μm and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultrafast long-wavelength photodetectors and receivers as well as electrically synchronized ultrahigh-speed devices and ICs

Published in:

Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE  (Volume:1 )

Date of Conference:

1-4 Dec 1998