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A unified analytical expression for aliasing error probability using single-input external- and internal-XOR LFSR

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3 Author(s)
Elsaholy, M.S. ; Higher Technol. Inst., Tenth of Ramadan City, Egypt ; Shaheen, S.I. ; Seireg, R.H.

In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR

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Computers, IEEE Transactions on  (Volume:47 ,  Issue: 12 )