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Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs

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8 Author(s)
LaBel, K.A. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; Marshall, P.W. ; Barth, J.L. ; Katz, R.B.
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We present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules

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Nuclear Science, IEEE Transactions on  (Volume:45 ,  Issue: 6 )