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Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator

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4 Author(s)
Pease, R.L. ; RLP Res., Albuquerque, NM, USA ; McClure, S. ; Gorelick, J. ; Witczak, S.C.

Ionization-induced degradation of the 29372 low-dropout voltage regulator is most severe at low-dose-rate (~10 mrad(SiO2)/s) and zero load current. The most sensitive parameter is the maximum output drive current, which is a function of the gain of the large lateral pnp output transistor. Significant degradation of this parameter occurs at 5-10 krad(SiO2) at low-dose-rate. A moderate load current (~250 mA) during irradiation significantly mitigates the damage. The mitigation of the damage is proportional to irradiation load current and is not a strong function of irradiation temperature or input voltage. The mechanism for the mitigation of damage appears to be current density dependent passivation of interface and/or border traps by mobile hydrogen-related species. The worst-case space system application is in unbiased spares

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Nuclear Science, IEEE Transactions on  (Volume:45 ,  Issue: 6 )