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Shape-optimized electrooptic beam scanners: experiment

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6 Author(s)
Fang, J.C. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Kawas, M.J. ; Zou, J. ; Gopalan, V.
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A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam. An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.

Published in:

Photonics Technology Letters, IEEE  (Volume:11 ,  Issue: 1 )