By Topic

Robust RTL power macromodels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bogliolo, A. ; Dipt. di Elettronica ed Computer Sci., Bologna Univ., Italy ; Benini, L.

In this paper, we propose a robust register-transfer level (RTL) power modeling methodology for functional units. Our models are consistently accurate over a wide range of input statistics, they are automatically constructed and can provide pattern-by-pattern power estimates. An additional desirable feature of our modeling methodology is the capability of accounting for the impact of technology variations, library changes and synthesis tools. Our methodology is based on the concept of node sampling, as opposed to more traditional approaches based on input sampling.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:6 ,  Issue: 4 )