Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Cycle-accurate macro-models for RT-level power analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Qing Wu ; Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA ; Qinru Qiu ; Pedram, M. ; Chih-Shun Ding

In this paper, we present a methodology and techniques for generating cycle-accurate macro-models for register transfer (RT)-level power analysis. The proposed macro-model predicts not only the cycle-by-cycle power consumption of a module, but also the moving average of power consumption and the power profile of the module over time. We propose an exact power function and approximation steps to generate our power macro-model. First-order temporal correlations and spatial correlations of up to order three are considered in order to improve the estimation accuracy. A variable reduction algorithm is designed to eliminate the "insignificant" variables using a statistical sensitivity test. Population stratification is employed to increase the model fidelity. Experimental results show our macro-models with 15 or fewer variables, exhibit <5% error for average power and <20% errors for cycle-by-cycle power estimation compared to circuit simulation results using Powermill.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:6 ,  Issue: 4 )