By Topic

An efficient method for approximating submesh reliability of two dimensional-meshes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chung-Yen Chang ; Amdahl Corp., Sunnyvale, CA, USA ; Mohapatra, P.

An analytical model for submesh reliability of mesh-connected systems is proposed in this paper. A mesh is considered operational as long as a functional submesh of the required size is available. We use the principle of inclusion and exclusion to find the exact probability of having a functional submesh within a partition of the mesh. The partitions are taken along either dimension of the mesh. The partitions along the rows are called row partitions (RPs) and along the columns are called column partitions (CPs). The reliability of a partition is then used to approximate the submesh reliability of the system and, thus, this model is called partitioned mesh (PM) model. Instead of using a computationally intensive recursive algorithm as done in the previous work, a closed form approximation of the submesh reliability is derived in this paper. The PM model is validated through simulation and compared with the earlier proposed approximation techniques. It is shown that the PM model provides better approximations for submesh reliability with constant computational complexity

Published in:

Parallel and Distributed Systems, IEEE Transactions on  (Volume:9 ,  Issue: 11 )