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Using laser defect avoidance to build large-area FPGAs

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2 Author(s)
Chapman, G.H. ; Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada ; Dufort, B.

Wafer-scale techniques of defect avoidance expend the complexity limits of field-programmable gate arrays by routing around flawed blocks to build working systems. Experiments on test FPGAs show that laser defect avoidance produces signal delays half those of active switches

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 4 )