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Fault analysis for networks with concurrent error detection

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3 Author(s)
Bolchini, C. ; Dipt. di Elettronica, Politecnico di Milano, Italy ; Salice, F. ; Sciuto, D.

The authors propose an approach for fault analysis and simulation of networks designed to have concurrent detection properties. The analysis characterizes all faults that may affect a device and determines the coverage, extracting test vectors and other parameters for evaluating device quality

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 4 )