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On-chip IDDQ testing in the AE11 fail-stop controller

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3 Author(s)
E. Bohl ; Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany ; T. Lindenkreuz ; M. Meerwein

Targeted for safety-critical applications, this microcontroller replaces the classic two-controller safety structure with a single controller containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combination of concurrent checking, BIST, and IDDQ testing-and considerably extended the standard cell-based design flow

Published in:

IEEE Design & Test of Computers  (Volume:15 ,  Issue: 4 )