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Online BIST for embedded systems

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3 Author(s)
Al-Asaad, H. ; Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA ; Murray, B.T. ; Hayes, J.P.

Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 4 )