Arbitrary-precision signal generation for mixed-signal built-in-self-test

This paper presents significant improvements in the generation of analog signals for on-chip analog circuit testing. In particular, the novel oscillators proposed here can achieve signal-to-noise ratios (SNRs) far greater than previous designs while remaining area efficiency. One particular example illustrates a 30-dB improvement in the SNR. Alternatively, signals can be generated with the same SNR as with older designs but over a wider range of frequencies. Multitone and bandpass signal generation are enhanced in the same fashion. Stability was studied empirically. Prototypes were built and satisfactorily tested on field-programmable gate array technology.