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Arbitrary-precision signal generation for mixed-signal built-in-self-test

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2 Author(s)
Haurie, X. ; Analog Devices Inc., Wilmington, MA, USA ; Roberts, G.W.

This paper presents significant improvements in the generation of analog signals for on-chip analog circuit testing. In particular, the novel oscillators proposed here can achieve signal-to-noise ratios (SNRs) far greater than previous designs while remaining area efficiency. One particular example illustrates a 30-dB improvement in the SNR. Alternatively, signals can be generated with the same SNR as with older designs but over a wider range of frequencies. Multitone and bandpass signal generation are enhanced in the same fashion. Stability was studied empirically. Prototypes were built and satisfactorily tested on field-programmable gate array technology

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Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on  (Volume:45 ,  Issue: 11 )