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On-chip capacitor measurement for high performance microprocessor

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1 Author(s)
Pham, N.H. ; IBM Corp., Austin, TX, USA

This paper describes a method to measure the dynamically changing on-chip capacitor of a high performance microprocessor while in operation. The capacitor's effectiveness in controlling the core voltage supply is presented

Published in:

Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on

Date of Conference:

26-28 Oct 1998