Referenced Items are not available for this document.
This paper describes a method to measure the dynamically changing on-chip capacitor of a high performance microprocessor while in operation. The capacitor's effectiveness in controlling the core voltage supply is presented
Published in:
Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
Date of Conference: 26-28 Oct 1998
- Page(s):
- 65 - 68
- Meeting Date :
- 26 Oct 1998-28 Oct 1998
- Print ISBN:
- 0-7803-4965-2
- INSPEC Accession Number:
- 6269784
- Conference Location :
- West Point, NY
- Digital Object Identifier :
- 10.1109/EPEP.1998.733751
- Product Type:
- Conference Publications
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