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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

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6 Author(s)
Crain, S.H. ; Aerosp. Corp., El Segundo, CA, USA ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J.
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Two generations of the 80Cx86 microprocessor family and two floating-point digital signal processor (DSP) of the SMJ320Cx0 family were tested for single event effects (SEE). The test results are presented here

Published in:

Radiation Effects Data Workshop, 1998. IEEE

Date of Conference:

24 Jul 1998