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Honeywell radiation hardened 32-bit processor single event effects test results

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5 Author(s)
Leavy, S.C. ; Space Syst., Honeywell Inc., Clearwater, FL, USA ; Mogensen, J.A. ; Smith, T.S. ; Freitfeld, G.J.
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We will present single event effects test results for the Honeywell radiation hardened 32-bit processor. The processor was tested at board-level while executing a signal and data processing benchmark suite

Published in:

Radiation Effects Data Workshop, 1998. IEEE

Date of Conference:

24 Jul 1998