Referenced Items are not available for this document.
We will present single event effects test results for the Honeywell radiation hardened 32-bit processor. The processor was tested at board-level while executing a signal and data processing benchmark suite
Published in:
Radiation Effects Data Workshop, 1998. IEEE
Date of Conference: 24 Jul 1998
- Page(s):
- 11 - 14
- Print ISBN:
- 0-7803-5109-6
- INSPEC Accession Number:
- 6220042
- Conference Location :
- Newport Beach, CA
- Digital Object Identifier :
- 10.1109/REDW.1998.731467
- Product Type:
- Conference Publications
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