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Well-thickness dependence of high-temperature characteristics in 1.3-μm AlGaInAs-InP strained-multiple-quantum-well lasers

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8 Author(s)
Ishikawa, T. ; Fujitsu Labs. Ltd., Atsugi, Japan ; Higashi, T. ; Uchida, T. ; Yamamoto, T.
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Well-thickness dependence of temperature characteristics of 1.3-/spl mu/m AlGaInAs-InP strained-multiple-quantum-well lasers was investigated. Higher characteristic temperatures of threshold current density were obtained for thicker wells up to 6 nm. Fabricated ridge-waveguide lasers with 6-nm-thick wells exhibited characteristic temperature of as high as 125 K. Relaxation-oscillation frequency reduced by only 13% between 25/spl deg/C and 85/spl deg/C.

Published in:
Photonics Technology Letters, IEEE  (Volume:10 ,  Issue: 12 )

Date of Publication: Dec. 1998

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