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Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies

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4 Author(s)
Li, D. ; Middlesex Univ., London ; Free, C.E. ; Pitt, K.E.G. ; Barnwell, P.G.

A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 μm

Published in:

Electronics Letters  (Volume:34 ,  Issue: 21 )