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Browse Journals & Magazines > Electronics Letters ...> Volume:34 Issue:21 Help

Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies

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4 Author(s)
Li, D. ; Middlesex Univ., London ; Free, C.E. ; Pitt, K.E.G. ; Barnwell, P.G.

A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 μm

Published in:
Electronics Letters  (Volume:34 ,  Issue: 21 )

Date of Publication: 15 Oct 1998

Page(s):
2042 - 2044
ISSN :
0013-5194
INSPEC Accession Number:
6078205
Digital Object Identifier :
10.1049/el:19981392
Date of Current Version :
06 August 2002
Issue Date :
15 Oct 1998
Sponsored by :
Institution of Engineering and Technology

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