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Sensitivity study of interconnect variation using statistical experimental design

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2 Author(s)
Lin, Z.J. ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; Spanos, Costas J.

We present a sensitivity study approach to evaluate the effects of interconnect variations on the performance of large, complex circuits. The approach uses highly efficient designed experiments. The results from the study of a multiplier circuit are presented as an example

Published in:

Statistical Metrology, 1998. 3rd International Workshop on

Date of Conference:

7 Jun 1998