By Topic

Approaches to statistical circuit analysis for deep sub-micron technologies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Orshansky, M. ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; Chen, J.C. ; Chenming Hu ; Wan, D.
more authors

Difficulties of statistical circuit analysis for deep submicron CMOS technologies are discussed. The complex patterns of variation in device parameters observed make previously used methods invalid. An approach that couples the extracted SPICE parameter sets with their physical locations is advocated as an alternative

Published in:

Statistical Metrology, 1998. 3rd International Workshop on

Date of Conference:

7 Jun 1998