Referenced Items are not available for this document.
Difficulties of statistical circuit analysis for deep submicron CMOS technologies are discussed. The complex patterns of variation in device parameters observed make previously used methods invalid. An approach that couples the extracted SPICE parameter sets with their physical locations is advocated as an alternative
Published in:
Statistical Metrology, 1998. 3rd International Workshop on
Date of Conference: 7 Jun 1998
- Page(s):
- 6 - 9
- Print ISBN:
- 0-7803-4338-7
- INSPEC Accession Number:
- 6147503
- Conference Location :
- Honolulu, HI
- Digital Object Identifier :
- 10.1109/IWSTM.1998.729753
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