Cart (Loading....) | Create Account
Close category search window

Reliability evaluation of composite systems considering voltage stability problems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Cheng Lin ; Dept. of Electr. Eng., Tsinghua Univ., Beijing, China ; Guo Yongji ; Xiao Kai

A new approach to evaluate reliability indices of composite system considering voltage stability based on Monte-Carlo simulation is presented. The adequacy analysis of each selected system state is carried out in two steps. In the first one, an optimal power flow, solved by a direct interior point (IP) method, is adopted to calculate the static voltage stability limit including maximum load and voltage limits in power systems. If the voltage instability occurs, the voltage limits are saved. In the second step, adequacy indices are evaluated considering changed load limits and voltage limits. A new software is developed based on the method mentioned above. Test of a 24-bus IEEE RTS shows that the software developed is valid

Published in:

Power System Technology, 1998. Proceedings. POWERCON '98. 1998 International Conference on  (Volume:2 )

Date of Conference:

18-21 Aug 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.