Referenced Items are not available for this document.
A new approach for the multiple fault location in linear analog circuits is proposed. It presents the characteristic of using classical numerical procedures together with symbolic analysis techniques, which is particularly useful in the parametric fault diagnosis field. The proposed approach is based on the k-fault hypothesis and is provided with efficient algorithms for fault location also in the case of low testability circuits. The developed algorithms have been used for realizing a software package prototype which implements a fully automated system for the fault location in linear analog circuits of moderate size
Published in:
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
(Volume:45
,
Issue:
10
)
Date of Publication: Oct 1998
- Page(s):
- 1383 - 1388
- ISSN :
- 1057-7130
- INSPEC Accession Number:
- 6101602
- Digital Object Identifier :
- 10.1109/82.728851
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Oct 1998
- Sponsored by :
- IEEE Circuits and Systems Society
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