Cart (Loading....) | Create Account
Close category search window
 

Basic study on the application of parametric spline functions to the holographic pattern measuring system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Taniguchi, M. ; Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan ; Tsuchiya, T. ; Takagi, T.

The authors have developed a holographic pattern measuring system (HPMS) for quantitative measurement of microscopic displacement and mechanical vibration with high precision. In this study, a parametric spline function (PSF) was applied to the HPMS in order to obtain highly accurate smooth curves for fringe patterns from these holographic interferograms. The relation between the number of sampled points and the error rate was also investigated, and some experiments were conducted

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 1 )

Date of Publication:

Feb 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.