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Compact emittance scanners for MeV particle beams

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3 Author(s)
O'Shea, P.G. ; Los Alamos Nat. Lab., NM, USA ; Zaugg, T.J. ; Hansborough, L.D.

Compact electric sweep emittance scanners have been developed to operate in the mega-electronvolt range. These scanners are suitable for the analysis of electron and ion beams. The scanners have excellent angular resolution despite their compact dimensions. Electrical and mechanical design and scaling parameters are presented. Operational experience with a 1 MeV, 25 mA, 50 μs H- beam is discussed

Published in:

Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE

Date of Conference:

20-23 Mar 1989