By Topic

Variation of soft X-ray emission with gas pressure in a plasma focus

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chee Mang Ng ; Dept. of Phys., Malaya Univ., Kuala Lumpur, Malaysia ; Siew Pheng Moo ; Chiow San Wong

The variation of the soft X-ray emission in a low energy (3 kJ, 15 kV) plasma focus over a range of pressures is investigated. The working gases are argon and an argon-hydrogen mixture. The X rays are detected using an assembly of PIN-Si diodes with differential filtering and with a multipinhole camera, soft X rays originating from the plasma and from electron beam activity on the copper anode are observed. In general, three pressure regimes can be discerned. In the first regime, both the plasma X rays and the copper line radiation are weak. In the second regime, the X-ray emission is intense and the contribution from copper lines is strong. In the third pressure regime, the plasma X rays are intense while contribution from the copper X-rays are weak

Published in:

Plasma Science, IEEE Transactions on  (Volume:26 ,  Issue: 4 )