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A study on accelerated preconditioning test

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3 Author(s)
Y. Sun ; Silicon Syst., Singapore ; E. C. Wong ; C. H. Ng

Preconditioning testing (PT) is widely used in the semiconductor industry for the testing of plastic SMDs. This test has 6 levels with 3 different temperature-humidity (TH) settings, and thus at least 3 TH ovens are needed to support conventional PT over 6 levels. This paper proposes an accelerated PT method to replace the conventional method, where PT at 6 levels can be conducted under one TH setting. This means that one oven is needed for PT over 6 levels. Also, the accelerated PT test time and cost at levels 2-6 are greatly reduced. In addition, it is not necessary for inspectors to change TH settings, so that possible human errors can be avoided

Published in:

Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st

Date of Conference:

8-10 Oct 1997