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A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults

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3 Author(s)
M. A. Gharaybeh ; Rutgers Univ., Piscataway, NJ, USA ; M. L. Bushnell ; V. D. Agrawal

A new simulation-based method uses single-input change (SIC) vectors to derive tests efficiently for singly testable (ST) path-delay faults (PDFs). A PDF is ST if there exists a delay test that guarantees its detection when it is the only PDF in the circuit. It is known that an ST PDF must have a single-input change test. We utilize this result and present a fault simulator that is specifically tuned to simulate single-input change vectors efficiently. We assign random values to all inputs, and then propagate rising and falling transitions from each input while all other inputs are held steady. We present a 16-valued algebra with which rising and falling PDF's from all inputs are concurrently simulated. Using a suitable encoding for signal values, gates are evaluated directly through Boolean operations, and all computation stages use machine word parallelism. Results on the ISCAS'85 and '89 benchmarks show that the approach is superior to another published method in terms of both fault coverage and execution time

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:17 ,  Issue: 9 )