Close category search window
 

Low-profile inverted-F antenna with parasitic elements on an infinite ground plane

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nakano, H. ; Coll. of Eng., Hosei Univ., Koganei, Japan ; Suzuki, R. ; Yamauchi, J.

An inverted-F antenna (IFA) whose height is approximately one-tenth of the wavelength is analysed in the presence of a single parasitic element. The resonance phenomena of the parasitic element and IFA are investigated. Based on this investigation, an IFA with a pair of parasitic elements is fabricated and analysed. It is found that the lower and higher resonance frequencies are independently determined by the parasitic element length and the IFA inner length, respectively. The independent resonance phenomena lead to the enhancement of the VSWR frequency bandwidth. A 26% VSWR frequency bandwidth, which is more than three times as wide as that of a conventional inverted-F antenna without parasitic elements, is realised. The radiation pattern and gain are also presented and discussed

Published in:
Microwaves, Antennas and Propagation, IEE Proceedings  (Volume:145 ,  Issue: 4 )

Date of Publication: Aug 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.