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Automatic generation of error control codes for computer applications

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3 Author(s)
Fummi, F. ; Dept. of Electron. & Inf., Politecnico di Milano, Italy ; Sciuto, D. ; Silvano, C.

This paper proposes a methodology, implemented in a tool, to automatically generate the main classes of error control codes (ECC's) widely applied in computer memory systems to increase reliability and data integrity. New code construction techniques extending the features of previous single error correcting (SEC)-double error detecting (DED)-single byte error detecting (SBD) codes have been integrated in the tool. The proposed techniques construct systematic odd-weight-column SEC-DED-SBD codes with odd-bit-per-byte error correcting (OBC) capabilities to enhance reliability in high speed memory systems organized as multiple-bit-per-chip or card.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:6 ,  Issue: 3 )