Scheduled System Maintenance:
On May 6th, single article purchases and IEEE account management will be unavailable from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). We apologize for the inconvenience.
By Topic

ARIANNA: the Icarus experiment readout module

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Carpanese, C. ; Dipt. di Fisica, Padova Univ., Italy ; Centro, S. ; Lippi, M. ; Pascoli, D.
more authors

Icarus detector is a liquid Argon Time Projection Chamber that requires continuous signal recording for each channel to provide three dimensional images of any ionizing event. A complete drift volume imaging of the next 600 ton module will result in 1.15 Gbit, with a data rate of 1.15 Tbit/s. The collected data can be highly reduced by recognizing Regions Of Interest (ROI) of the signal by means of a custom hit finding unit (DAEDALUS) working pipelined in the data acquisition path. DAEDALUS is an ASIC that implements an algorithm developed for hit detection and proven to be very efficient both on real and on simulated data. Since only ROI's are saved in memory and contiguous regions can be correlated to enhance detector self triggering capability, a high efficiency zero skipping is obtained in real time. A VME board hosting 16 Icarus digital channels has been designed and built as a demonstrator for functionality and performance test. The board, named ARIANNA, and DAEDALUS chip are here presented in detail

Published in:

Nuclear Science, IEEE Transactions on  (Volume:45 ,  Issue: 4 )