Cart (Loading....) | Create Account
Close category search window
 

Identification of man-made regions in unmanned aerial vehicle imagery and videos

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Solka, J.L. ; Adv. Comput. Technol. Group, Naval Surface Warfare Center, Dahlgren, VA, USA ; Marchette, D.J. ; Wallet, B.C. ; Irwin, V.L.
more authors

Details work in our group on the use of low-level features for the identification of man-made regions in unmanned aerial vehicle (UAV) imagery. The feature sets that we have examined include classical statistical features such as the coefficient of variation in a window about a pixel, locally computed fractal dimension, and fractal dimension computed in the presence of wavelet boundaries. We discuss these techniques of feature extraction along with our approach to the classification of the features. Our classification work has focused on the use of a semiparametric probability density estimation technique. In addition, we present classification results for region of interest identification based on a set of test images from an UAV test flight

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:20 ,  Issue: 8 )

Date of Publication:

Aug 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.