By Topic

The 3-D fractal analysis of electrical trees using a serial sectioning method and a CT method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Uehara, H. ; Dept. of Electr. Eng., Meiji Univ., Kawasaki, Japan ; Kudo, K.

In order to reconstruct the 3D patterns of real electrical trees, we investigated the applicability of computerized tomography method (CTM) and the serial sectioning method (SSM). We also investigated the relationship between the fractal dimension of the reconstructed 3D patterns and that of projected 2D patterns of real electrical trees, from the point of view of fractal dimension. It was pointed out that it is important to estimate the fractal dimension of spatial patterns precisely and 3-dimensionally

Published in:

Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on

Date of Conference:

22-25 Jun 1998