Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Electric charge 3-dimensional profile measurement in dielectrics using acoustic microscope probe head

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xiaokui Qin ; Pohl Inst. of Solid State Phys., Tongji Univ., Shanghai, China ; Suzuki, K. ; Sazaki, M. ; Tanaka, Y.
more authors

In this paper, we report our attempt of measuring the three-dimensional space charge distribution in a PMMA plate, which is irradiated by an electron beam, using an acoustic lens by the pressure wave propagation (PWP) method

Published in:

Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on

Date of Conference:

22-25 Jun 1998