Cart (Loading....) | Create Account
Close category search window
 

High sensitivity precision relative intensity noise calibration standard using low noise reference laser source

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Cox, M.C. ; DERA Aquila, Bromley, UK ; Copner, N.J. ; Williams, B.

The intensity noise of laser diodes is an increasingly important parameter for broadband analogue and high data rate telecommunication systems. The authors describe a new primary calibration standard for measuring the relative intensity noise (RIN) as a function of frequency (up to 20 GHz) with high sensitivities (<-171 dBm/Hz). In addition a new optical technique has been developed based on a low noise optical source which provides an adjustable shot noise level. By comparing this flat noise spectrum with the test spectrum the main traceable path is provided by the measured DC photocurrent. Errors due to responsivity, gain, mismatch etc., as a function of frequency are significantly reduced and precisions of <0.4 dB have been achieved

Published in:

Science, Measurement and Technology, IEE Proceedings -  (Volume:145 ,  Issue: 4 )

Date of Publication:

Jul 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.