Cart (Loading....) | Create Account
Close category search window

Fault detection and isolation for nonlinear processes based on local linear fuzzy models and parameter estimation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Balle, P. ; Inst. of Autom. Control, Darmstadt Univ. of Technol., Germany ; Isermann, Rolf

An approach for model-based fault detection and isolation (FDI) of sensor and process faults for nonlinear processes is presented. A fuzzy model (Takagi-Sugeno type) of the nominal process provides characteristic features like time constants and static gains in the actual region of operation. Comparing these with features derived by recursive parameter estimation leads to significant symptoms which indicate the state of the system. The practical applicability is illustrated on an industrial scale thermal plant. Here, nine different faults can be detected and isolated continuously over all ranges of operation

Published in:

American Control Conference, 1998. Proceedings of the 1998  (Volume:3 )

Date of Conference:

21-26 Jun 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.