By Topic

Effect of medium thickness on the signal-to-noise ratio of perpendicular media

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ikeda, Y. ; Tokyo Res. Lab., IBM Japan, Kanagawa, Japan ; Sonobe, Y. ; Uchida, H.

The effect of the medium thickness of Co-Cr and Co-Cr-Pt perpendicular media on the signal-to-noise ratio (S/N) was investigated by using two different types of merged magnetoresistive (MR) heads. Two types of medium were employed in this measurement: Cr-rich Co72 -Cr28 and (Co72Cr28)78Pt22 which have high-anisotropy field (Hk). The write demagnetization increased when a shorter write gap was used. The high SM value for the Cr-rich Co-Cr medium does not decrease even for a large medium thickness of 100-300 nm; however, the SM of the Co-Cr-Pt medium decreases with increasing thickness. To obtain a high SM value, two types of medium can be used. One is a Co-Cr-Pt medium whose thickness is less than 50 nm, and the other is a Cr-rich Co-Cr medium whose thickness is sufficient for thermal stability. The Cr-rich Co-Cr medium, which shows a high S/N for a large medium thickness of over 100 nm, will contribute to the thermal stability of magnetic bits at future high recording densities of 10 Gbits/in2 and beyond

Published in:

Magnetics, IEEE Transactions on  (Volume:34 ,  Issue: 4 )