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Alpha 21164 manufacturing test development and coverage analysis

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4 Author(s)
C. J. Stoucny ; Compaq Comput. Corp., Shrewsbury, MA, USA ; R. Davies ; P. McKernan ; T. Truong

To meet the challenge of creating test vectors for the Alpha 21164 microprocessor, Compaq's engineers describe a test generation and grading scheme that solves time-to-market, quality and cost concerns

Published in:

IEEE Design & Test of Computers  (Volume:15 ,  Issue: 3 )