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Pentium Pro processor design for test and debug

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2 Author(s)
Carbine, A. ; Intel Corp., Hillsboro, OR, USA ; Feltham, D.

The need to quickly ramp a complex, high-performance microprocessor into high-volume manufacturing with low defect rates led this design team to a custom, low-area DFT approach and a manually written test methodology that targeted several fault models. Their approach effectively balanced testability needs with other design constraints, while enabling excellent time to market and test quality

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 3 )