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Testing NASA's 3D-stack MCM space flight computer

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3 Author(s)
Sasidhar, K. ; Georgia Inst. of Technol., Atlanta, GA, USA ; Alkalai, L. ; Chatterjee, A.

Advanced packaging technologies pose major testing challenges for complex designs. The authors present test strategies used in the space flight computer designed for NASA's Deep Space-1 mission

Published in:

Design & Test of Computers, IEEE  (Volume:15 ,  Issue: 3 )