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SRAM test using on-chip dynamic power supply current sensor

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2 Author(s)
Jian Liu ; Fujitsu Labs. Ltd., San Jose, CA, USA ; Makki, R.Z.

We present an overview of power supply current testing of SRAMs and propose a test method to improve the CMOS SRAM test efficiency by using on-chip dynamic power supply current sensors. It is shown that the test method provides full observability of cell switching and allows for a significant reduction in test time. The test length is O(n) including coupling faults

Published in:

Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on

Date of Conference:

24-25 Aug 1998