By Topic

Statistical design of integrated circuits using maximum likelihood estimation of the covariance matrix

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Seifi, A. ; Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada ; Vlach, J. ; Ponnambalam, K.

A new formulation is proposed for statistical design of integrated circuits with correlated input parameters. The method uses a polyhedral approximation of the feasible region and finds the maximum volume ellipsoid contained in that polyhedron. The orientation of the ellipsoid is fixed by a maximum likelihood estimate (MLE) of the correlation matrix. The ellipsoid center is a nominal design with the maximum yield. The covariance estimation is formulated as a semidefinite program which uses the sampling observations as input data. The design centering problem is presented as a second-order cone programming and solved by a special interior-point optimization algorithm. The optimal design of a switched-capacitor filter is presented

Published in:

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on  (Volume:6 )

Date of Conference:

31 May-3 Jun 1998