IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > American Control Conference, ... Help

Optimal hold functions for MDCS sampled-data problems

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mirkin, L. ; Fac. of Mech. Eng., Technion-Israel Inst. of Technol., Haifa, Israel ; Palmor, Z.J.

In this paper the H2 and H∞ sampled-data problems with mixed discrete/continuous specifications (MDCS) are considered. The hold function is not fixed a priory but rather is the design parameter. The (sub-)optimal controller obtained is of the form of a serial interconnection of a (sub-)optimal digital controller and a (sub-)optimal hold function

Published in:
American Control Conference, 1998. Proceedings of the 1998  (Volume:6 )

Date of Conference: 21-26 Jun 1998

Page(s):
3704 - 3708 vol.6
Meeting Date :
24 Jun 1998-26 Jun 1998
ISSN :
0743-1619
Print ISBN:
0-7803-4530-4
INSPEC Accession Number:
6091054
Conference Location :
Philadelphia, PA
Digital Object Identifier :
10.1109/ACC.1998.703329
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.