Cart (Loading....) | Create Account
Close category search window

A governing equation based fault detection and diagnosis algorithm and its application in a chemical plant

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jie Zhang ; Res. Inst. of Autom. Control, East China Univ. of Sci. & Tech., Shanghai, China ; Suzhen Zhang ; Thornhill, N.

This paper describes a governing equation fault detection and diagnosis algorithm, which is based on Kramer's (1987) approach and extended it to deal with multiple faults. The algorithm is specifically designed to overcome disturbances and uncertainties in the process which might result in diagnostic instability. The approach is used to detect and/or diagnose the following faults: sensor faulty status of fails-high and fails-low, sticking valve, plant leaks, and other unanticipated or novel faults. The algorithm was installed on a distributed control system of a PET plant in Dec. 1995, and continues to be used thus demonstrating the success of the fault detection and diagnosis approach

Published in:

American Control Conference, 1998. Proceedings of the 1998  (Volume:4 )

Date of Conference:

21-26 Jun 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.