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A generalized approach to optical low-coherence reflectometry including spectral filtering effects

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3 Author(s)
Wiedmann, U. ; Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France ; Gallion, P. ; Guang-Hua Duan

In the interpretation of optical low-coherence reflectometry measurements, the reflectivity of the device under test is in general supposed to be with a slow dependency on optical wavelength. However, recent research aims at investigating strongly wavelength-dependent devices, such as fiber Bragg gratings and semiconductor lasers. In this paper, a general theory including spectral filtering effects is developed. It appears as a generalization of previously reported results only valid under special conditions

Published in:

Lightwave Technology, Journal of  (Volume:16 ,  Issue: 7 )

Date of Publication:

Jul 1998

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